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VIEW Metrology

Critical Dimensional Measurement Systems
Seeing and measuring the impossible

VIEW Metrology

Critical Dimensional Measurement Systems
Seeing and measuring the impossible

Menu

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VIEW Metrology

Benchmark 250

Benchmark 300

Benchmark 450

Benchmark XLT

Pinnacle 250

Pinnacle Plus

Summit 600/625/800

Microline AF/AF Plus

VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

Benchmark250_High-Res-1509x2048

Benchmark 250

A compact, high-accuracy dimensional measurement system

Benchmark300_High-Res-1489x2048

Benchmark 300

High Performance Floor Model Optical Metrology System 

Benchmark450_High-Res

Benchmark 450

Exceptional value in a high-accuracy dimensional measurement system

Benchmark1500_High-Res-2048x1792

Benchmark XLT

Extra large format dimensional metrology system

Pinnacle250_High-Res-1293x2048

Pinnacle 250

A high throughput, high-accuracy dimensional metrology system

PinnaclePlus_High-Res-1365x2048

Pinnacle Plus

Elevates Pinnacle performance to the next level

Summit600_High-Res-1097x1536

Summit 600/625/800

A large travel, high-accuracy dimensional measurement system

MicroLine_2000_AF_High-Res-768x1126

Microline AF/AF Plus

Offers exceptional linewidth and overlay measurement capability

Evolving the Science of Precision

V Eye Precision Limited.

19/51 Moo 3, Phaholyothin Road. Klong-nueng, Klongluang, Pathumthani 12120 Thailand 

Tel : 02-902-0593-4

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